OS GSO ISO 18118:2025

ISO 18118:2024

Omani Standard Current Edition · Approved on 14 October 2025

Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials

OS GSO ISO 18118:2025 Files

English 22 Pages

Current Edition Reference Language

OMR 62.31

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OS GSO ISO 18118:2025 Scope

This document gives guidance on the measurement and use of experimentally-determined relative sensitivity factors for the quantitative analysis of homogeneous materials by Auger electron spectroscopy and X-ray photoelectron spectroscopy. The methods described only apply to polycrystalline and amorphous materials, as effects inherent to single-crystal samples are not addressed.

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